21-05-2025
Nearfield Instruments And Singapore's A*STAR IME Sign Research Collaboration Agreement To Advance Semiconductor Metrology Solutions For Ai And Advanced Packaging Era
SINGAPORE, May 21 (Bernama) -- Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies.
By leveraging Nearfield Instruments' expertise in high-precision metrology and A*STAR IME's cutting-edge semiconductor research, the partnership will accelerate the development of advanced metrology solutions that enable efficient AI chip production.
